Category Archives: AFM

atomic force microscopy

AFM and Roughness

AFMs can measure nanoscale roughness from sub micron to less than an angstrom.  However, there are two main factors which need to be considered when using these instruments for this type of measurement:

1) Vertical Resolution – How the system scans in Z
2) Spatial Resolution – How the system scans in XY

Vertical Resolution.  How well the system measures vertically is a function of the noise floor of the system.  If the sample feature size is 1nm, the system needs to have a vertical noise floor less than 1nm in order to measure the feature adequately.  The largest vertical feature that you can measure will be equal to the noise floor or the Z resolution limit.  This noise floor measures all of the mechanical and electrical movement or noise in the system.  It is easiest measured by setting the scan size to 0, using the parameters that you will use to measure the sample.  When the tip is not moving across the surface any measured variation over time is due to noise int he system and will mask any surface features once the tip starts to move.  For measuring the lowest noise floor achievable, many companies use a standard set of parameters so that they compare values.

Spatial Resolution.  Since the movement in XY is almost always larger than that in Z.  The lateral resolution of the an AFM isn’t limited by system noise, but by the radius of curvature (ROC) of the tip.  The sharper the tip, the better the resolution.  Super sharp commercial cantilevers have a ROC about 2-3nm.  Standard AFM probes have a nominal ROC of 6nm.  Any probe used for advanced modes usually has a coating not the to make them sensitive to a particular signal of interest.  These probes can have have ROCs 20nm or more.

In addition to the ROC, it is important to keep the tip sharp without blunting the tip to maintain a) the highest resolution possible and b) to maintain a stable and consistent image.  If the tip wears during the coarse of imaging.  The first image may look dramatically different from the last image on the same sample surface.  In cases where the feature size is much smaller than the tip size, a condition called tip imaging (tip self imaging, reverse imaging) will occur where the features surface features will be representative of the end of the tip rather than the surface itself.

What to do?  Understand the noise floor of your system.  This will determine what are the limits of the machine. Know what the specifications of your probe are and what condition it is in.  This will provide you with confidence that the images you are seeing are representative of the sample surface.

Happy Scanning….

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Useful AFM Resources

I have spent a lot of time installing AFMs and training customers to work with them.  There were a lot of everyday questions which came up, one of the most popular questions was where to buy supplies.  If you are part of an established lab then you probably are aware of these resources, but if you are setting up a lab or new to the field, then this list is for you.  Of course, you can always purchase supplies from your AFM manufacturer, but there are also third party companies which offer high quality supplies for your needs.    It is helpful to have some useful resources for a quick and easy place to find things.  Otherwise, you can spend countless hours surfing the web.  Some of places I like to purchase supplies are from:

AFM Manufacturers (not a complete list but some of the more prominent companies which have been around)
– AFM Workshop –
Supplies (carbon tape, samples, sample disks, tweezers, cantilevers)
– SPI Instruments
Cantilevers Manufacturers
– Applied Nanostructures –
– Budget Sensors –
– MikroMasch –
– Nanosensors –
– Nanoworld –
– VistaProbe –
Cantilever Distributors
Specialty Probes
– CNT Probes – Carbon Design Innovations –
– Diamond Probes – ADProbe –
– High Aspect Ratio Probes – Team Nanotec –